Ambipolar injection into pentacene field effect transistor observed by time-resolved optical second harmonic generation imaging
نویسندگان
چکیده
Ambipolar carrier injection from gold electrode into pentacene was investigated by time-resolved optical second harmonic generation (TRM-SHG) imaging. Smooth hole injection is verified by rapid decrease of the SHG intensity at the electrode edge, indicating the absence of an injection barrier. In contrast, TRM-SHG results clearly indicated the presence of electron injection from the high-work function metal into the electrode, though after injection electrons were trapped in the channel and could not contribute to the conduction. Transient electric field distribution due to the injected holes and electrons were evaluated based on the SHG intensity distribution.
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